Raman and AFM studies of (As2S3)0.45(SbSI)0.55 thin films and bulk glass

被引:4
作者
Azhniuk, Yu. M. [1 ]
Villabona, A. [2 ]
Gomonnai, A. V. [1 ]
Rubish, V. M. [3 ]
Marjan, V. M. [3 ]
Gomonnai, O. O. [4 ]
Zahn, D. R. T. [2 ]
机构
[1] Ukr Nat Acad Sci, Inst Electron Phys, UA-88017 Uzhgorod, Ukraine
[2] Tech Univ Chemnitz, D-09107 Chemnitz, Germany
[3] Ukr Nat Acad Sci, Inst Informat Recording, Uzhhorod Sci & Technol Ctr, UA-88017 Uzhgorod, Ukraine
[4] Uzhgorod Natl Univ, UA-88000 Uzhgorod, Ukraine
关键词
Chalcogenide film; Raman scattering; Atomic force microscopy; Laser irradiation; Crystallization; GES2-SBSI GLASSES; SBSI; AS2S3; SPECTROSCOPY; SCATTERING; FABRICATION; LIGHT;
D O I
10.1016/j.jnoncrysol.2014.04.015
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
(As2S3)(0.45)(SbSI)(0.55) thin films were studied by Raman spectroscopy and atomic force microscopy. Laser-induced crystallization of SbSI crystallites from the amorphous (As2S3)(0.45)(SbSI)(0.55) thin films was observed in micro-Raman measurements as a result of local laser beam heating. The dependence of the observed effect on the laser power and the film pre-heating duration is discussed. No such effects were observed for bulk glasses with a similar composition. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:36 / 40
页数:5
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