共 50 条
- [1] Characterization of As2S3 thin surface films using sem and afm methods EnǍchescu, M. (marius.enachescu@upb.ro), 1600, Politechnica University of Bucharest (76):
- [2] CHARACTERIZATION OF As2S3 THIN SURFACE FILMS USING SEM AND AFM METHODS UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN-SERIES A-APPLIED MATHEMATICS AND PHYSICS, 2014, 76 (02): : 215 - 222
- [3] RESONANT RAMAN-SCATTERING IN AS2S3 AMORPHOUS THIN-FILMS PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1978, 87 (02): : 479 - 483
- [4] Photodarkening in amorphous As2S3 thin films CHINESE PHYSICS LETTERS, 2002, 19 (01): : 124 - 126
- [5] Surface degradation of As2S3 thin films PHYSICS AND CHEMISTRY OF GLASSES-EUROPEAN JOURNAL OF GLASS SCIENCE AND TECHNOLOGY PART B, 2006, 47 (06): : 681 - 687
- [10] Tunable Raman lasing in an As2S3 chalcogenide glass microsphere OPTICS EXPRESS, 2021, 29 (04): : 5580 - 5587