Impact of misfit relaxation and a-domain formation on the electrical properties of tetragonal PbZr0.4Ti0.6O3/PbZr0.2Ti0.8O3 thin film heterostructures: Experiment and theoretical approach

被引：13

作者：

Feigl, Ludwig ^{[1
]}

Misirlioglu, I. B. ^{[1
]}

Vrejoiu, Ionela ^{[1
]}

Alexe, Marin ^{[1
]}

Hesse, Dietrich ^{[1
]}

机构：

[1] Max Planck Inst Microstruct Phys, D-06120 Halle, Germany

来源：

JOURNAL OF APPLIED PHYSICS | 2009年 / 105卷 / 06期

关键词：

crystal microstructure; dielectric polarisation; dislocations; electric domains; ferroelectric materials; ferroelectric thin films; lead compounds; permittivity; pulsed laser deposition; strontium compounds; transmission electron microscopy; zirconium compounds; FERROELECTRIC-FILMS; PYROELECTRIC PROPERTIES; STRAIN RELAXATION; DEAD LAYER; DISLOCATIONS; CAPACITORS; SURFACE; ORIGIN; SCALE;

D O I：

10.1063/1.3056164

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Heterostructures consisting of PbZr0.2Ti0.8O3 and PbZr0.4Ti0.6O3 epitaxial films on a SrTiO3 (100) substrate with a SrRuO3 bottom electrode were prepared by pulsed laser deposition. By using the additional interface provided by the ferroelectric bilayer structure and changing the sequence of the layers, the content of dislocations and elastic domain types was varied in a controlled manner. The resulting microstructure was investigated by transmission electron microscopy. Macroscopic ferroelectric measurements have shown a large impact of the formation of dislocations and 90 degrees domain walls on the ferroelectric polarization and dielectric constant. A thermodynamic analysis using the Landau-Ginzburg-Devonshire approach that takes into account the ratio of the thicknesses of the two ferroelectric layers and electrostatic coupling is used to shed light on the experimental data.

引用

页数：7

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