High-Brightness InGaNGaN Power Flip-Chip LEDs

被引:11
作者
Chang, Shoou-Jinn [1 ,2 ]
Chen, W. S. [1 ,2 ]
Shei, S. C. [3 ]
Kuo, C. T. [4 ]
Ko, T. K. [4 ]
Shen, C. F. [4 ]
Tsai, J. M. [1 ,2 ]
Lai, Wei-Chi [5 ]
Sheu, Jinn-Kong [5 ]
Lin, A. J. [4 ]
机构
[1] Natl Cheng Kung Univ, Inst Microelect, Adv Optoelect Technol Ctr, Ctr Micro Nano Sci & Technol, Tainan 70101, Taiwan
[2] Natl Cheng Kung Univ, Dept Elect Engn, Adv Optoelect Technol Ctr, Ctr Micro Nano Sci & Technol, Tainan 70101, Taiwan
[3] Natl Univ Tainan, Dept Elect Engn, Tainan 700, Taiwan
[4] Epistar Corp, Hsin Shi 744, Taiwan
[5] Natl Cheng Kung Univ, Inst Electroopt Sci & Engn, Tainan 70101, Taiwan
关键词
Flip-chip; grinding; InGaN-GaN light emitting diodes (LEDs); rough sapphire surface; LIGHT-EMITTING-DIODES; NITRIDE-BASED LEDS; EXTRACTION EFFICIENCY; SAPPHIRE SUBSTRATE; GAN; SURFACE; IMPROVEMENT; CONTACTS; OUTPUT; LAYER;
D O I
10.1109/JLT.2008.2005849
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the fabrication of InGaN-GaN power flip-chip (FC) light-emitting diodes (LEDs) with a roughened sapphire backside surface prepared by grinding. It was found that we can increase output power of the FC LED by about 35% by roughening the backside surface of the sapphire substrate. The reliability of the proposed device was also better, as compared to power FC LEDs with a conventional flat sapphire backside surface. © 2009 IEEE.
引用
收藏
页码:1985 / 1989
页数:5
相关论文
共 19 条
[1]   Nitride based power chip with indium-tin-oxide p-contact and Al back-side reflector [J].
Chang, CS ;
Chang, SJ ;
Su, YK ;
Chen, WS ;
Shen, CF ;
Shei, SC ;
Lo, HM .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (4B) :2462-2464
[2]   Highly reliable high-brightness GaN-based flip chip LEDs [J].
Chang, S. J. ;
Chen, W. S. ;
Shei, S. C. ;
Ko, T. K. ;
Shen, C. F. ;
Hsu, Y. P. ;
Chang, C. S. ;
Tsai, J. M. ;
Lai, W. C. ;
Lin, A. J. .
IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2007, 30 (04) :752-757
[3]   Nitride-based LEDs with 800 °C grown p-AllnGaN-GaN double-cap layers [J].
Chang, SJ ;
Wu, LW ;
Su, YK ;
Hsu, YP ;
Lai, WC ;
Tsai, JA ;
Sheu, JK ;
Lee, CT .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2004, 16 (06) :1447-1449
[4]   Nitride-based LEDs with p-InGaN capping layer [J].
Chang, SJ ;
Chen, CH ;
Chang, PC ;
Su, YK ;
Chen, PC ;
Jhou, YD ;
Hung, H ;
Wang, SM ;
Huang, BR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (12) :2567-2570
[5]   Highly reliable nitride-based LEDs with SPS plus ITO upper contacts [J].
Chang, SJ ;
Chang, CS ;
Su, YK ;
Chuang, RW ;
Lin, YC ;
Shei, SC ;
Lo, HM ;
Lin, HY ;
Ke, JC .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 2003, 39 (11) :1439-1443
[6]   InGaN-GaN multiquantum-well blue and green light-emitting diodes [J].
Chang, SJ ;
Lai, WC ;
Su, YK ;
Chen, JF ;
Liu, CH ;
Liaw, UH .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2002, 8 (02) :278-283
[7]   400-nm InGaN-GaN and InGaN-AlGaN multiquantum well light-emitting diodes [J].
Chang, SJ ;
Kuo, CH ;
Su, YK ;
Wu, LW ;
Sheu, JK ;
Wen, TC ;
Lai, WC ;
Chen, JF ;
Tsai, JM .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2002, 8 (04) :744-748
[8]   Historical climate and stream flow trends and future water demand analysis in the Calgary region, Canada [J].
Chen, Z. ;
Grasby, S. E. ;
Osadetz, K. G. ;
Fesko, P. .
WATER SCIENCE AND TECHNOLOGY, 2006, 53 (10) :1-11
[9]   Increase in the extraction efficiency of GaN-based light-emitting diodes via surface roughening [J].
Fujii, T ;
Gao, Y ;
Sharma, R ;
Hu, EL ;
DenBaars, SP ;
Nakamura, S .
APPLIED PHYSICS LETTERS, 2004, 84 (06) :855-857
[10]   Improvement of light extraction efficiency of flip-chip light-emitting diode by texturing the bottom side-surface of sapphire substrate [J].
Han, Dae-Seob ;
Kim, Ja-Yeon ;
Na, Seok-In ;
Kim, Sang-Hoon ;
Lee, Ki-Dong ;
Kim, Bongjin ;
Park, Seong-Ju .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2006, 18 (13-16) :1406-1408