Influence of N2 background pressure on the incorporation of arsenic during molecular beam epitaxy growth of GaAs

被引:2
作者
Dieing, T [1 ]
Usher, BF [1 ]
机构
[1] La Trobe Univ, Dept Elect Engn, Bundoora, Vic 3086, Australia
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2004年 / 22卷 / 03期
关键词
D O I
10.1116/1.1755712
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The influence of a high N-2 background pressure on the molecular beam epitaxy growth of GaAs has been investigated. Measurements to determine the minimum As-4 pressure necessary to maintain stoichiometric growth at different substrate temperatures with and without a high N-2 background pressure were performed. The As-4 pressures required for cases when a high N-2 background was present were systematically above those required without a N-2 background. The GaAs growth process has been modeled using kinetic rate equations and by including surface site blocking terms the model accounts for the data taken by the authors. The model also agrees well with GaAs growth kinetic data published by several other authors. (C) 2004 American Vacuum Society.
引用
收藏
页码:1544 / 1548
页数:5
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