ScGaN and ScAlN: emerging nitride materials

被引:115
作者
Moram, M. A. [1 ]
Zhang, S. [2 ]
机构
[1] Univ London Imperial Coll Sci Technol & Med, Dept Mat, Exhibit Rd, London SW7 2AZ, England
[2] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB3 0FS, England
基金
英国工程与自然科学研究理事会;
关键词
LIGHT-EMITTING-DIODES; SCANDIUM NITRIDE; BAND-GAP; THIN-FILMS; PIEZOELECTRIC RESPONSE; ELECTRONIC-PROPERTIES; GROWTH; INGAN; MICROSTRUCTURE; DECOMPOSITION;
D O I
10.1039/c3ta14189f
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This review addresses the recent development and future prospects for Sc-based III-nitride alloys in energy-efficient device applications. Wurtzite-structure ScAlN and ScGaN alloys are wide band-gap semiconductors which can be stabilised at the low Sc contents relevant to devices, can be grown epitaxially, include the lattice-matched Sc0.18Al0.82N/GaN system, retain direct band gaps in the near-UV region up to 25% ScN and 50% ScN respectively, and should offer significantly higher exciton binding energies and piezoelectric coefficients compared to other III-nitrides. These properties greatly expand the options for band gap and polarisation engineering required for efficient optoelectronic devices, high-electron mobility transistors and energy-harvesting devices.
引用
收藏
页码:6042 / 6050
页数:9
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