A sampled-line reflectometer for submillimeter-wave measurements

被引：0
|
作者：
Ülker, S [1 ]
Weikle, RM [1 ]
机构：
[1] Univ Virginia, Sch Engn & Appl Sci, Charlottesville, VA 22904 USA
来源：
2002 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3 | 2002年
关键词：
six-port network analyzers; submillimeterwave systems; reflectometers; Schottky diodes;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A reflectometer designed for operation at submillimeter wavelengths and based on the sampled-transmission line architecture is described. The reflectometer is a relatively simple implementation of the six-port network analyzer introduced by Engen and consists of a section of rectangular waveguide and an ensemble of Schottky diode power detectors. Design considerations for the instrument are described and measurements in the 270 GHz to 285 GHz range are presented and discussed.
引用
收藏
页码：1677 / 1680
页数：4
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