A-plane (1120) InN growth on nitridated R-plane (1012) sapphire by ECR-MBE

被引:31
作者
Kumagai, Y.
Tsuyuguchi, A.
Naoi, H.
Araki, T.
Na, H.
Nanishi, Y.
机构
[1] Dept Photon, Kusatsu, Shiga 5258577, Japan
[2] Ritsumeikan Univ, Ctr Promot, COE Program, Shiga 5258577, Japan
来源
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2006年 / 243卷 / 07期
关键词
D O I
10.1002/pssb.200565383
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A-plane (11 (2) over bar0) InN has been successfully grown on R-plane (10 (1) over bar2) sapphire substrate by electron cyclotron resonance (ECR) plasma-exited molecular beam epitaxy through substrate nitridation process. The substrate nitridation of R-plane sapphire by ECR nitrogen plasma was carried out at 430 degrees C for 10 and 15 min. The results of reflection high-energy electron diffraction (RHEED), X-ray diffraction (XRD), and scanning electron microscopy indicated the formation of A-plane InN on R-plane sapphire. Inclusion of cubic InN was also observed together with A-plane InN through RHEED and XRD measurements in case of A-plane InN layer grown on 10 min nitridated substrate. However, when the nitridation time of R-plane sapphire by ECR nitrogen plasma increased to 15 min, it is confirmed that formation of cubic InN was successfully suppressed.
引用
收藏
页码:1468 / 1471
页数:4
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