Time Domain Measurement of Near Field Emissions from Complex PCBs

被引:0
|
作者
Thomas, D. W. P. [1 ]
Smartt, C. [1 ]
Nasser, H. [1 ]
Baharuddin, M. [1 ]
Greedy, S. [1 ]
Gradoni, G. [2 ]
Creagh, S. C. [2 ]
Tanner, G. [2 ]
机构
[1] Univ Nottingham, George Green Inst Electromagnet Res, Nottingham, England
[2] Univ Nottingham, Sch Math Sci, Nottingham, England
来源
2016 46TH EUROPEAN MICROWAVE CONFERENCE (EUMC) | 2016年
基金
英国工程与自然科学研究理事会;
关键词
near-field; electromagnetic compatibility; time domain; measurement;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper discusses how the measurements of the near-field emissions in the time domain can be used to characterize the broadband emissions from complex sources such as multifunctional Printed Circuit Boards (PCBs). The near fields, transverse to the measurement surface, are sufficient to characterise the radiator provided the surface contains all the significant fields. For time domain measurements, the field probe is calibrated over a broad bandwidth for both amplitude and phase to provide the probe impulse response. A suitable digital filter applied with the same probe impulse response to extract the time domain magnetic field data from the probe output voltage. Results show that good agreement in the can be obtained. The measured near fields can then be used to create an equivalent model of the PCB which can be used to predict the emissions in the far field or in any environment. In this work the objective is to create an equivalent time dependent dipole array model of the DUT.
引用
收藏
页码:707 / 710
页数:4
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