Chemical effects on the optical band-gap of heavily doped ZnO:MIII (M=Al,Ga,In): An investigation by means of photoelectron spectroscopy, optical measurements under pressure, and band structure calculations

被引:119
作者
Sans, J. A. [1 ]
Sanchez-Royo, J. F. [1 ]
Segura, A. [1 ]
Tobias, G. [2 ]
Canadell, E. [3 ]
机构
[1] Univ Valencia, MALTA Consolider Team, Dept Fis Aplicada ICMUV, E-46100 Valencia, Spain
[2] Univ Oxford, Inorgan Chem Lab, Oxford OX1 3QR, England
[3] Campus Univ Autonoma Barcelona, CSIC, ICMAB, Barcelona 08193, Spain
来源
PHYSICAL REVIEW B | 2009年 / 79卷 / 19期
关键词
aluminium; band structure; Brillouin zones; conduction bands; density functional theory; electron density; energy gap; Fermi level; gallium; indium; photoelectron spectra; renormalisation; semiconductor thin films; valence bands; zinc compounds; PULSED-LASER DEPOSITION; ZINC-OXIDE FILMS; THIN-FILMS; EMITTING DIODE; RENORMALIZATION; PSEUDOPOTENTIALS; SEMICONDUCTORS; ABSORPTION; DEPENDENCE; SIESTA;
D O I
10.1103/PhysRevB.79.195105
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Chemical effects on the conduction-band filling and band-gap renormalization in ZnO thin films doped with group-III elements (Al, Ga, and In) are investigated by means of optical and photoemission experiments and first-principles density-functional calculations. The Fermi-level position, as obtained from ultraviolet photoemission measurements, exhibits a relatively small and positive shift (about 0.4 eV) with respect to the valence band for increasing electron concentrations up to 10(21) cm(-3). The optical gap exhibits a much larger increase for the same concentration range and the total shift appears to be smaller for In-doped ZnO. Absorption measurements under pressure show that the pressure coefficient of the optical gap is correlated with the electron concentration in films, decreasing with increasing electron concentration. As a consequence, the contributions of band filling and band-gap renormalization to the optical-gap shift can be separated on the basis of the different pressure behavior of the physical parameters involved in each effect. Standard models on band-gap narrowing fail to give account of these results. Supercell density-functional calculations show that the conduction band of heavily doped ZnO is modified by the presence of group-III doping elements, which give rise to small gaps in specific points of the Brillouin zone, modifying the conduction band dispersion in the way predicted, in a much simpler approach, by the band-anticrossing model.
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页数:9
相关论文
共 49 条
[1]   Systematic generation of finite-range atomic basis sets for linear-scaling calculations [J].
Anglada, E ;
Soler, JM ;
Junquera, J ;
Artacho, E .
PHYSICAL REVIEW B, 2002, 66 (20) :1-4
[2]  
Artacho E, 1999, PHYS STATUS SOLIDI B, V215, P809, DOI 10.1002/(SICI)1521-3951(199909)215:1<809::AID-PSSB809>3.0.CO
[3]  
2-0
[4]   New challenges on gallium-doped zinc oxide films prepared by r.f. magnetron sputtering [J].
Assunçao, V ;
Fortunato, E ;
Marques, A ;
Gonçalves, A ;
Ferreira, I ;
Aguas, H ;
Martins, R .
THIN SOLID FILMS, 2003, 442 (1-2) :102-106
[5]   ANOMALOUS OPTICAL ABSORPTION LIMIT IN INSB [J].
BURSTEIN, E .
PHYSICAL REVIEW, 1954, 93 (03) :632-633
[6]   High-pressure Raman spectroscopy study of wurtzite ZnO [J].
Decremps, F ;
Pellicer-Porres, J ;
Saitta, AM ;
Chervin, JC ;
Polian, A .
PHYSICAL REVIEW B, 2002, 65 (09) :921011-921014
[7]   INTENSITY OF OPTICAL ABSORPTION BY EXCITONS [J].
ELLIOTT, RJ .
PHYSICAL REVIEW, 1957, 108 (06) :1384-1389
[8]   Effects of carrier concentration on the dielectric function of ZnO:Ga and In2O3:Sn studied by spectroscopic ellipsometry: Analysis of free-carrier and band-edge absorption [J].
Fujiwara, H ;
Kondo, M .
PHYSICAL REVIEW B, 2005, 71 (07)
[9]   ELECTRONIC-STRUCTURE AND ENERGETICS OF SAPPHIRE (0001) AND (1102) SURFACES [J].
GUO, J ;
ELLIS, DE ;
LAM, DJ .
PHYSICAL REVIEW B, 1992, 45 (23) :13647-13656
[10]   Fabrication and optoelectronic properties of a transparent ZnO homostructural light-emitting diode [J].
Guo, XL ;
Choi, JH ;
Tabata, H ;
Kawai, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2001, 40 (3A) :L177-L180