Enhancement of hole-injection and power efficiency of organic light emitting devices using an ultra-thin ZnO buffer layer

被引:49
作者
Huang, Hsin-Hsuan [1 ]
Chu, Sheng-Yuan [1 ,2 ,3 ]
Kao, Po-Ching [4 ]
Chen, Yung-Chen [1 ]
Yang, Ming-Ru [1 ]
Tseng, Zong-Liang [1 ]
机构
[1] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 70101, Taiwan
[2] Natl Cheng Kung Univ, Inst Nanotechnol & Microsyst Engn, Tainan 701, Taiwan
[3] Natl Cheng Kung Univ, Ctr Micro Nano Sci & Technol, Tainan 701, Taiwan
[4] Natl Chiayi Univ, Dept Appl Phys, Chiayi 60083, Taiwan
关键词
ZnO; OLED; X-ray and ultra-violet photoelectron spectroscopies; Hole-injection; INDIUM-TIN-OXIDE; ELECTROLUMINESCENT DEVICES; DIODES; FILMS; ANODE; SPECTROSCOPY; IMPROVEMENT; ELECTRODES; CATHODE;
D O I
10.1016/j.jallcom.2008.12.122
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The advantages of using an anode buffer layer of ZnO on the electro-optical properties of organic light emitting devices (OLEDs) are reported. ZnO powders were thermal-evaporated and then treated with ultra-violet (UV) ozone exposure to make the ZnO layers. The turn-on voltage of OLEDs decreased from 4 V (4.2 cd/m(2)) to 3 V (3.4 cd/m(2)) and the power efficiency increased from 2.7 Im/W to 4.7 Im/W when a 1-nm-thick ZnO layer was inserted between indium tin oxide (ITO) anodes and alpha-naphthylphenylbiphenyl diamine (NPB) hole-transporting layers. X-ray and ultra-violet photoelectron spectroscopy (XPS and UPS) results revealed the formation of the ZnO layer and showed that the work function increased by 0.59 eV when the ZnO/ITO layer was treated by UV-ozone for 20 min. The surface of the ZnO/ITO film became smoother than that of bare ITO film after the UV-ozone treatment. Thus, the hole-injection energy barrier was lowered by inserting an ZnO buffer layer, resulting in a decrease of the turn-on voltage and an increase of the power efficiency of OLEDs. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:520 / 524
页数:5
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