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Enhancement of hole-injection and power efficiency of organic light emitting devices using an ultra-thin ZnO buffer layer
被引:49
作者:
Huang, Hsin-Hsuan
[1
]
Chu, Sheng-Yuan
[1
,2
,3
]
Kao, Po-Ching
[4
]
Chen, Yung-Chen
[1
]
Yang, Ming-Ru
[1
]
Tseng, Zong-Liang
[1
]
机构:
[1] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 70101, Taiwan
[2] Natl Cheng Kung Univ, Inst Nanotechnol & Microsyst Engn, Tainan 701, Taiwan
[3] Natl Cheng Kung Univ, Ctr Micro Nano Sci & Technol, Tainan 701, Taiwan
[4] Natl Chiayi Univ, Dept Appl Phys, Chiayi 60083, Taiwan
关键词:
ZnO;
OLED;
X-ray and ultra-violet photoelectron spectroscopies;
Hole-injection;
INDIUM-TIN-OXIDE;
ELECTROLUMINESCENT DEVICES;
DIODES;
FILMS;
ANODE;
SPECTROSCOPY;
IMPROVEMENT;
ELECTRODES;
CATHODE;
D O I:
10.1016/j.jallcom.2008.12.122
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
The advantages of using an anode buffer layer of ZnO on the electro-optical properties of organic light emitting devices (OLEDs) are reported. ZnO powders were thermal-evaporated and then treated with ultra-violet (UV) ozone exposure to make the ZnO layers. The turn-on voltage of OLEDs decreased from 4 V (4.2 cd/m(2)) to 3 V (3.4 cd/m(2)) and the power efficiency increased from 2.7 Im/W to 4.7 Im/W when a 1-nm-thick ZnO layer was inserted between indium tin oxide (ITO) anodes and alpha-naphthylphenylbiphenyl diamine (NPB) hole-transporting layers. X-ray and ultra-violet photoelectron spectroscopy (XPS and UPS) results revealed the formation of the ZnO layer and showed that the work function increased by 0.59 eV when the ZnO/ITO layer was treated by UV-ozone for 20 min. The surface of the ZnO/ITO film became smoother than that of bare ITO film after the UV-ozone treatment. Thus, the hole-injection energy barrier was lowered by inserting an ZnO buffer layer, resulting in a decrease of the turn-on voltage and an increase of the power efficiency of OLEDs. (C) 2009 Elsevier B.V. All rights reserved.
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页码:520 / 524
页数:5
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