The effect of SiO2 doping content on microstructure and dielectric properties of 0.99Ba0.5Sr0.5TiO3-0.01SnO2 ceramics

被引：0
|
作者：
Song, Chunlin [1 ]
Shi, Mengqi [1 ]
Liu, Lanlan [1 ]
机构：
[1] Southwest Univ, Fac Mat & Energy, Chongqing, Peoples R China
来源：
FERROELECTRICS | 2018年 / 537卷 / 01期
关键词：
SiO2; doped; dielectric property; BST ceramics; microstructure; ELECTRICAL-PROPERTIES; THIN-FILMS;
D O I：
10.1080/00150193.2018.1528957
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
SiO2 doped BSTS ceramics were obtained by the conventional electroceramic processing. XRD was performed to confirm the phase. Meanwhile, the SEM images show the direct proof of the second phase, which is in good agreement with XRD results. The formed second phase have effect on the densification and dielectric properties, which will be further analyzed and discussed in the study.
引用
收藏
页码：61 / 67
页数：7
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