Structural, morphological and optical properties of spray-formed silver-doped zinc sulphide thin films

被引：19

作者：

Offor, P. O. ^{[1
]}

Whyte, G. M. ^{[2
]}

Ezekoye, V. A. ^{[2
]}

Omah, A. D. ^{[1
]}

Ude, S. N. ^{[1
]}

Ocheri, C. ^{[1
]}

Ezukwoke, N. ^{[3
]}

Ezema, I. C. ^{[1
]}

Madiba, I. G. ^{[4
,5
]}

Okorie, B. A. ^{[1
]}

Maaza, Malik ^{[4
,5
]}

Ezema, Fabian I. ^{[2
,4
,5
,6
]}

机构：

[1] Univ Nigeria, Met & Mat Engn Dept, Nsukka, Nigeria

[2] Univ Nigeria, Dept Phys & Astron, Nsukka, Nigeria

[3] Univ Nigeria, Elect Engn Dept, Nsukka, Nigeria

[4] iThemba LABS Nat Res Fdn, Nanosci African Network NANOAFNET, 1 Old Faure Rd,POB 722, ZA-7129 Somerset West, Western Cape Pr, South Africa

[5] Univ South Africa UNISA, Coll Grad Studies, UNESCO UNISA Africa Chair Nanosci Nanotechnol, POB 392, Pretoria, South Africa

[6] Coal City Univ, Fac Nat & Appl Sci, Dept Phys, Enugu, Nigeria

来源：

OPTIK | 2019年 / 185卷

关键词：

Thin film; Silver; Zinc sulphide; Raman spectrometry; CHEMICAL BATH DEPOSITION; ZNS; GROWTH;

D O I：

10.1016/j.ijleo.2019.03.063

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The study focused on the qualities of spray-formed Silver-doped Zinc sulphide (ZnS) thin films sprayed on soda-lime glass (slg) substrate. Silver-doped and undoped ZnS thin films with 0%, 1%, 3% and 5% Silver concentrations were deposited. The qualities of the synthesized films were investigated using x-ray diffractometry, scanning electron microscopy, Fourier transforms infrared (FTIR) spectrometry, UV-VIS spectrophotometry, Raman spectrometry and contact angle techniques. The x-ray diffraction data identified cubic structures forthin films. Scanning electron microscopy shows the presence of agglomerates of nanoparticles and pores in the thin films. The thin films' crystallite size ranges between 3.107 and 4.103 nm. FTIR revealed the chemical bonds in the film. The transmittance of the thin films is between 42.35 and 81.86% at 550 nm, the energy gap is observed within a range of 3.11 and 3.60 eV while the indices of refraction are in the range of 1.52-3.81 at 550 nm wavelength. Photoluminescence result shows Sulphur vacancies. A hydrophilic surface feature of the film was revealed by the contact angle measurement.

引用

页码：519 / 528

页数：10