Femtosecond dynamic diffraction imaging: X-ray snapshots of ultra-fast nanoscale phenomena

被引：0

作者：

Barty, Anton ^{[1
]}

Boutet, Sebastien ^{[2
]}

Bogan, Michael ^{[1
]}

Hau-Riege, Stefan ^{[1
]}

Marchesini, Stefano ^{[1
]}

Sokolowski-Tinten, Klaus ^{[3
]}

Cavalleri, Andrea ^{[4
]}

Dusterer, Stefan ^{[5
]}

Frank, Matthias ^{[1
]}

Bajt, Sasa ^{[1
,5
]}

Hajdu, Janos ^{[6
]}

Treusch, Rolf ^{[5
]}

Seibert, Marvin ^{[6
]}

Chapman, Henry ^{[1
,7
]}

机构：

[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[2] Stanford Linear Accelerator Ctr, Menlo Pk, CA USA

[3] Univ Duisberg Essen, Duisburg, Germany

[4] Univ Oxford, Dept Phys, Clarendon Lab, Oxford, England

[5] DESY, Deutsch Elektronen Synchrotron, Hamburg, Germany

[6] Uppsala Univ, Dept Cell & Mol Biol, Lab Mol Biophys, SE-75124 Uppsala, Sweden

[7] Univ Hamburg, DESY, Ctr Free Electron Laser Sci, D-22607 Hamburg, Germany

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2008年 / 64卷

关键词：

XFEL; ultrafast imaging; phase retrieval;

D O I：

10.1107/S0108767308096189

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

MS.69.2

引用

页码：C118 / C119

页数：2

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