A Robust Single Event Upset Hardened Clock Distribution Network

被引：8

作者：

Mallajosyula, Aahlad ^{[1
]}

Zarkesh-Ha, Payman ^{[1
]}

机构：

[1] Univ New Mexico, Dept Elect & Comp Engn, Albuquerque, NM 87131 USA

来源：

2008 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP FINAL REPORT | 2008年

关键词：

D O I：

10.1109/IRWS.2008.4796101

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single event upset along with the technology scaling decreases the reliability of the present CMOS circuits. It has recently been shown that the clock distribution network is becoming increasingly vulnerable to single event upset. In this paper a new technique is proposed, that can eliminate more than 90% of SEU in clock distribution network. The proposed technique incurs minimal area overhead and requires negligible design effort.

引用

页码：121 / 124

页数：4