The analytical relations between particles and probe trajectories in atomic force microscope nanomanipulation

被引：37

作者：

Rao, A. ^{[1
]}

Gnecco, E. ^{[1
,2
]}

Marchetto, D. ^{[3
,4
]}

Mougin, K. ^{[5
]}

Schoenenberger, M. ^{[1
]}

Valeri, S. ^{[3
,4
]}

Meyer, E. ^{[1
,2
]}

机构：

[1] Univ Basel, Dept Phys, CH-4056 Basel, Switzerland

[2] Swiss Nanosci Inst, CH-4056 Basel, Switzerland

[3] Univ Modena & Reggio Emilia, Dept Phys, I-41100 Modena, Italy

[4] CNR INFM Natl Res Ctr S3, I-41100 Modena, Italy

[5] ICSI CNRS, F-68057 Mulhouse, France

来源：

NANOTECHNOLOGY | 2009年 / 20卷 / 11期

关键词：

CONTROLLED MANIPULATION; GOLD NANOPARTICLES; NANOMETER-SCALE;

D O I：

10.1088/0957-4484/20/11/115706

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Analytical expressions relating the trajectories of spherical nanoparticles pushed by an atomic force microscope tip to the scan pattern of the tip are derived. In the case of a raster scan path, the particles are deflected in a direction defined by the geometries of tip and particles and the spacing b between consecutive scan lines. In the case of a zigzag scan path, the particles are deflected in a range of directions around 90 degrees, also depending on the parameter b. Experimental results on gold nanoparticles manipulated on silicon surfaces in ambient conditions confirm the predictions of our model.

引用

页数：6

共 24 条

[1] Nanoparticle manipulation by mechanical pushing: underlying phenomena and real-time monitoring [J].