Microstructure and Magnetic Properties of Fe-Ga Thin Films

被引：0
|
作者：
Wang Tianle [1 ,2 ]
Feng Shangshen [2 ]
Li Yanping [1 ,2 ]
Li Zhigang [2 ]
Shao Xianyi [2 ]
Cai Peiyang [2 ]
机构：
[1] Zhejiang Sci Tech Univ, Hangzhou 310018, Zhejiang, Peoples R China
[2] Taizhou Univ, Taizhou 317000, Peoples R China
来源：
RARE METAL MATERIALS AND ENGINEERING | 2017年 / 46卷 / 02期
关键词：
Fe-Ga films; magnetron sputtering; thin film structure; magnetic properties; magnetic domain; MAGNETOSTRICTIVE PROPERTIES;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Fe(83)Gai(7) thin films were prepared on Si(100) substrates by a dc magnetron sputtering method with sputtering powers 40 W <= P <= 80 W. The structure and magnetic properties of the films were investigated by X-ray diffraction (XRD), scanning electron microscope (SEM), physical property measurement system (PPMS) and magnetic force microscope (MFM). The results show that all samples exhibit a (110) disordered bcc structure; in addition, the grain size of Fe83Ga17 thin films is 40 similar to 70 nm;with increasing of the sputtering power, the grain size slowly increases and the films become thicker. The remanent magnetization M-r and the remanence ratio M-r/M-s decrease slowly with increasing of the sputtering power while the trend of the coercivity H-C is opposite. However, the change of the saturation magnetization M-s is not apparent. The magnetic domain (MD) patterns are the labyrinth structure and the domain sizes are increased with increasing of the sputtering power.
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页码：406 / 410
页数：5
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