Structural, optical and waveguiding properties improvement of SiO2/TiO2 Bragg reflectors processed by the sol-gel method under the effect of Ni-doped TiO2 and annealing duration

被引：9

作者：

Sedrati, H. ^{[1
]}

Bensaha, R. ^{[1
]}

Bensouyad, H. ^{[1
]}

Miska, P. ^{[2
]}

Robert, S. ^{[2
]}

机构：

[1] Univ Constantine, Lab Ceram, Constantine 25000, Algeria

[2] Nancy Univ, CNRS UMR 7198, Inst Jean Lamour, F-54506 Vandoeuvre Les Nancy, France

来源：

MATERIALS RESEARCH BULLETIN | 2014年 / 57卷

关键词：

Bragg reflectors; Nickel doped TiO2; Photoluminescence; Raman spectroscopy; Waveguide; THIN-FILMS; RAMAN-SPECTRUM; FABRICATION; DESIGN; NANOCRYSTALS; TEMPERATURE; ELECTRODES; COATINGS; ANATASE; ERBIUM;

D O I：

10.1016/j.materresbull.2014.06.015

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigated the nickel doped TiO2 layer and annealing duration effects on SiO2/TiO2 Bragg reflectors. The films crystallize in pure anatase phase whatever is the Ni content and the annealing duration. In UV-vis-NIR analyses, variations of width, position and transmission coefficient of the stop-band were observed. The PL spectra red-shifted when the Ni content and annealing duration increased. As the annealing duration increases, an additional sharp emission peak appears around 867 nm, indicating a reduced number of defects. As Ni content increased, the M-lines spectroscopy shows two transverse electric polarization guided modes TE0 and TE1, which indicates a decreased refractive index and an increased film thickness. (C) 2014 Elsevier Ltd. All rights reserved.

引用

页码：287 / 292

页数：6

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