Effect of power supply failure on the metrological characteristics of solid-state voltage standards

被引：0
|
作者：
Aprelev, AV
机构：
来源：
MEASUREMENT TECHNIQUES | 1996年 / 39卷 / 12期
关键词：
D O I：
10.1007/BF02375411
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The effect of power supply failure on the output voltage of solid-state voltage standards was studied experimentally. It was found that on-off switching of the supply voltage of solid-state voltage standards based on precision Zener diodes or its reduction below the specified level can lead to a considerable deterioration of their metrological characteristics.
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页码：1221 / 1224
页数：4
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