Time-resolved vibration measurement with temporal speckle pattern interferometry

Temporal speckle pattern interferometry (TSPI) is an optical measurement procedure for measuring the displacement of rough technical surfaces. The time-dependent speckle modulation due to optical path difference changes is tracked during the whole displacement of the surface and then evaluated pointwise without referring to neighboring pixels. This feature allows for its use as independent point sensors. This aspect of incremental phase tracking enables TSPI to be used to measure time-resolved mechanical vibrations. It also reduces the deteriorating effect of the decorrelation. Therefore large displacements can be measured. A concept for an inexpensive fiber-optical point sensor was developed and the theoretical accuracy for vibration measurement was investigated. The TSPI measurement of a loudspeaker membrane is compared with a high-precision vibrometer measurement. The first results show good agreement. (c) 2006 Optical Society of America.