Imaging atomic-level random walk of a point defect in graphene

被引：110

作者：

Kotakoski, Jani ^{[1
,2
]}

Mangler, Clemens ^{[1
]}

Meyer, Jannik C. ^{[1
]}

机构：

[1] Univ Vienna, Fac Phys, A-1090 Vienna, Austria

[2] Univ Helsinki, Dept Phys, FI-00014 Helsinki, Finland

来源：

NATURE COMMUNICATIONS | 2014年 / 5卷

基金：

奥地利科学基金会;

关键词：

DISLOCATION;

D O I：

10.1038/ncomms4991

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Deviations from the perfect atomic arrangements in crystals play an important role in affecting their properties. Similarly, diffusion of such deviations is behind many microstructural changes in solids. However, observation of point defect diffusion is hindered both by the difficulties related to direct imaging of non-periodic structures and by the timescales involved in the diffusion process. Here, instead of imaging thermal diffusion, we stimulate and follow the migration of a divacancy through graphene lattice using a scanning transmission electron microscope operated at 60 kV. The beam-activated process happens on a timescale that allows us to capture a significant part of the structural transformations and trajectory of the defect. The low voltage combined with ultra-high vacuum conditions ensure that the defect remains stable over long image sequences, which allows us for the first time to directly follow the diffusion of a point defect in a crystalline material.

引用

页数：5

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