From sub-monolayer to multilayer - an in situ X-ray diffraction study of the growth of Pd films on Pt(111)

被引:46
作者
Ball, MJ
Lucas, CA [1 ]
Markovic, NM
Stamenkovic, V
Ross, PN
机构
[1] Univ Liverpool, Dept Phys, Oliver Lodge Lab, Liverpool L69 7ZE, Merseyside, England
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
基金
英国工程与自然科学研究理事会;
关键词
surface structure; morphology; roughness; and topography; surface relaxation and reconstruction; platinum; palladium; X-ray scattering; diffraction and reflection; solid-liquid interfaces; electrochemical methods;
D O I
10.1016/S0039-6028(02)02122-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The structure of electrochemically deposited Pd thin films on the Pt(111) electrode surface has been studied by a combination of cyclic voltammetry (CV) and in situ synchrotron surface X-ray scattering. The films were examined at successively higher levels of thickness, ranging from the sub-monolayer regime to the n ML (n > 2) regime. We found that on top of a pseudomorphic monolayer film, Pd forms three-dimensional islands which, in the n ML (n > 2) regime are described using a half-Lorentzian distribution of layer occupation. These islands provide the large number of Pd step sites that give rise to the peak in the CV at 0.3 V. The deposition of Pd onto Pt(1 11), therefore, proceeds via a pseudomorphic Stranski-Krastanov growth mode. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:201 / 209
页数:9
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