Two-beam interferometry with a definitive phase-shift sign

被引:0
|
作者
Agashkov, A. V. [1 ,2 ]
机构
[1] Natl Acad Sci Belarus, B I Stepanov Inst Phys, Minsk, BELARUS
[2] Natl Acad Sci Belarus, B I Stepanov Inst Phys, Minsk 220072, BELARUS
关键词
NEGATIVE-INDEX; METAMATERIAL;
D O I
10.1364/JOT.89.000697
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Subject of study. The shift direction of interference fringes depending on the sign of the local phase shift introduced to one of the interfering waves was investigated in terms of two-beam interferometry. Aim of study. This study aimed to validate the fact that two-beam interferometry based on a single interferogram enables definitive determination of the phase-shift sign using the shift direction of the interference fringe. Method. Positions of the interference fringes and their shifts were calculated considering the phase distribution of interfering waves in the observation plane. The Mach-Zehnder interferometer was used to experimentally confirm the obtained theoretical results. Two closely adjacent substrates were used as objects. A subwavelength layer of a standard material was deposited on a part of the surface of one substrate, and a layer of metamaterial was deposited on the part of the second substrate. Main results. Expressions determining the direction and amplitude of the shift of interference fringes depending on the sign and amplitude of the local phase shift in one of the two interfering waves with a plane or spherical front were obtained. Strict rules of interference fringe shift depending on the sign of the phase shift were formulated based on the calculations. Results of the experiment using the Mach-Zehnder interferometer with different combi-nations of beams with spherical and plane wavefronts confirmed the theoretical calculations. Practical significance. Classic interferometric methods require significant time and the application of complex experimental procedures to determine the sign of the phase shift. The application of the results obtained in this study enables the deter-mination of the sign of the introduced local phase shift based on a single interferogram without additional time expenditures. Thus, the method investigating the metamaterial layers of a subwavelength thickness is significantly simplified.(c) 2023 Optica Publishing Group
引用
收藏
页码:697 / 703
页数:7
相关论文
共 50 条
  • [11] Phase control with two-beam interferometry method in a terahertz dielectric wakefield accelerator
    Wang, Dan
    Su, Xiaolu
    Yan, Lixin
    Du, YingChao
    Tian, Qili
    Liang, Yifan
    Niu, Lujia
    Huang, Wenhui
    Gai, Wei
    Tang, Chuanxiang
    Antipov, Sergey
    APPLIED PHYSICS LETTERS, 2017, 111 (17)
  • [12] Phase shifting interferometry from two normalized interferograms with random tilt phase-shift
    Liu, Fengwei
    Wu, Yongqian
    Wu, Fan
    OPTICS EXPRESS, 2015, 23 (15): : 19932 - 19946
  • [13] MEASUREMENT OF THE PHOTOREFRACTIVE PHASE-SHIFT BY POLARIZATION INTERFEROMETRY
    ING, RK
    MONCHALIN, JP
    OPTICS LETTERS, 1993, 18 (11) : 852 - 854
  • [14] LASER INTERFEROMETRY BY ELECTROOPTICAL PHASE-SHIFT CONTROL
    MIRON, N
    REVUE ROUMAINE DE PHYSIQUE, 1987, 32 (1-2): : 223 - 226
  • [15] EFFECT OF SPURIOUS REFLECTION ON PHASE-SHIFT INTERFEROMETRY
    AI, C
    WYANT, JC
    APPLIED OPTICS, 1988, 27 (14): : 3039 - 3045
  • [16] Phase-shift speckle-shearing interferometry
    Vishnyakov, G. N.
    Ivanov, A. D.
    Levin, G. G.
    Minaev, V. L.
    QUANTUM ELECTRONICS, 2020, 50 (07) : 636 - 642
  • [17] Measurement of fine surface profile with two-wavelength phase-shift interferometry
    Nishikawa, Takayuki
    Takayasu, Takurou
    Iwata, Koichi
    Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 1991, 57 (09): : 1633 - 1638
  • [18] Phase-shift extraction for generalized phase-shifting interferometry
    Gao, Peng
    Yao, Baoli
    Lindlein, Norbert
    Mantel, Klaus
    Harder, Irina
    Geist, Eduard
    OPTICS LETTERS, 2009, 34 (22) : 3553 - 3555
  • [19] REFERENCE PHASE-SHIFT DETERMINATION PHASE-SHIFTING INTERFEROMETRY
    PERRY, KE
    MCKELVIE, J
    OPTICS AND LASERS IN ENGINEERING, 1995, 22 (02) : 77 - 90
  • [20] Phase-shift calibration algorithm for phase-shifting interferometry
    Chen, X
    Gramaglia, M
    Yeazell, JA
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2000, 17 (11): : 2061 - 2066