Level-Crossing ADC Performance Evaluation Toward Ultrasound Application

被引:65
作者
Kozmin, Kirill [1 ]
Johansson, Jonny [1 ]
Delsing, Jerker [1 ]
机构
[1] Lulea Univ Technol, Embedded Internet Syst LAB EISLAB, S-97187 Lulea, Sweden
关键词
Irregular sampling; level-crossing analog-to-digital converter (ADC); simulation; TO-DIGITAL CONVERTER; PIPELINED ADC; CMOS;
D O I
10.1109/TCSI.2008.2010094
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A performance evaluation of a level-crossing analog-to-digital converter (ADC) is presented. It is shown that its signal-to-noise ratio (SNR) does not depend on the input-signal amplitude, which results in an almost-flat SNR for amplitudes that fall into the Nyquist criteria for irregular sampling. The influence of the reconstruction procedure on SNR is discussed, and possible limitations due to the comparator and clock on the performance of the ADC are analyzed. This analysis allows for specification of comparator and clock parameters such that they do not limit the ADC performance yet are not overestimated. In conclusion, a previously known level-crossing ADC design procedure is extended. A level-crossing ADC design example is given for intended use in an ultrasound application with a frequency band from 1 to 10 MHz. MATLAB and Cadence simulations, which utilize the data obtained from a real comparator and clock, are presented, and the performance of such a level-crossing ADC is compared with a conventional ADC.
引用
收藏
页码:1708 / 1719
页数:12
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