Purification and optical properties of TlBr crystals

被引：10

作者：

Yu, Shijin ^{[1
]}

Zhou, Dongxiang ^{[1
]}

Gong, Shuping ^{[1
]}

Zheng, Zhiping ^{[1
]}

Hu, Yunxiang ^{[1
]}

Wang, Chuan ^{[1
]}

Quan, Lin ^{[1
]}

机构：

[1] Huazhong Univ Sci & Technol, Engn Res Ctr Funct Ceram, Minist Educ, Dept Elect Sci & Technol, Wuhan 430074, Peoples R China

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2009年 / 602卷 / 02期

基金：

中国国家自然科学基金;

关键词：

TlBr; Crystals; Purification; Absorption; Transmittance; Trace element analysis; RADIATION DETECTOR; X-RAY; GROWTH;

D O I：

10.1016/j.nima.2009.01.022

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

TlBr was synthesized by chemical precipitation, purified by the hydrothermal re-crystallization method, and grown by the vertical Bridgman method. Trace element analysis at ppb/ppm level was made using inductively coupled plasma mass spectroscopy. A significant reduction of the impurity concentration was observed as a function of the cooling rate. The concentrations of impurities of Ca, Fe, Mg, K, Zn, Cu, Na, and Si decreased obviously after hydrothermal re-crystallization. In addition, the optical properties of TlBr wafers were compared using spectra in the wavelength ranges of 400-600 and 2500-20000 nm. Compared to the wafer grown from the re-crystallized powder, the wafer grown from the non-purified powder exhibits a large absorption coefficient and small transmission in the range of 450-600 nm, a shift of the absorption edge to a longer wavelength region, and a decrease of the average IR transmittance value. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：484 / 488

页数：5

共 20 条

[1] CHARACTERIZATION OF P-TYPE CDTE BRIDGMAN CRYSTALS BY INFRARED EXTINCTION SPECTRA [J].

BECKER, U ;

RUDOLPH, P ;

BOYN, R ;

WIENECKE, M ;

UTKE, I .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1990, 120 (02) :653-660

[2] The solubility of salts and salt mixtures in water at temperatures over 100 degrees I [J].

Benrath, A ;

Gjedebo, F ;

Wunderlich, H .

ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, 1937, 231 (03) :285-297

[3] Doping impact on the electro-optical properties of a TlBr crystal [J].

Dmitriev, Yuri ;

Bennett, Paul R. ;

Cirignano, Leonard J. ;

Gupta, Tapan K. ;

Higgins, William M. ;

Shah, Kanai S. ;

Wong, Philip .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2007, 578 (03) :510-514

[4] Thallium bromide optical and radiation detectors for X-ray and gamma-ray spectroscopy [J].

Hitomi, K ;

Matsumoto, M ;

Muroi, O ;

Shoji, T ;

Hiratate, Y .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (05) :2526-2529

[5] TlBr gamma-ray spectrometers using the depth sensitive single polarity charge sensing technique [J].

Hitomi, Keitaro ;

Onodera, Toshiyuki ;

Shoji, Tadayoshi ;

Hiratate, Yukio ;

He, Zhong .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2008, 55 (03) :1781-1784

[6] Influence of zone purification process on T1Br crystals for radiation detector fabrication [J].

Hitomi, Keltaro ;

Onodera, Toshiyuki ;

Shoji, Tadayoshi .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2007, 579 (01) :153-156

[7] THALLIUM HALIDE CRYSTAL COUNTER [J].

HOFSTADTER, R .

PHYSICAL REVIEW, 1947, 72 (11) :1120-1121

[8] BANDGAP DEPENDENCE AND RELATED FEATURES OF RADIATION IONIZATION ENERGIES IN SEMICONDUCTORS [J].

KLEIN, CA .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (04) :2029-+

[9] Development of the technology for growing TlBr detector crystals [J].

Kouznetsov, MS ;

Lisitsky, IS ;

Zatoloka, SI ;

Gostilo, VV .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2004, 531 (1-2) :174-180

[10] Effects of polishing and etching on TlBr single crystals [J].

Kozlov, V ;

Leskelä, M ;

Kemell, M ;

Sipilä, H .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2006, 563 (01) :58-61

← 1 2 →