The Determination of the Electronic Parameters of Thin Amorphous Organic Films by Ellipsometric and Spectrophotometric Study

被引：5
作者：
Nosidlak, Natalia [1 ]
Dulian, Piotr [2 ]
Mierzwinski, Dariusz [3 ]
Jaglarz, Janusz [3 ]
机构：
[1] Cracow Univ Technol, Inst Phys, 1 Podchorazych, PL-30084 Krakow, Poland
[2] Cracow Univ Technol, Fac Chem Engn & Technol, 24 Warszawska St, PL-31155 Krakow, Poland
[3] Cracow Univ Technol, Fac Mat Engn, 37 JPII St, PL-31155 Krakow, Poland
来源：
COATINGS | 2020年 / 10卷 / 10期
关键词：
polythiophenes; spectroscopic ellipsometry; spectrophotometry; optical constants; POLYMER; DEPENDENCE; MOBILITY;
D O I：
10.3390/coatings10100980
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The aim of this work was the determination of the basic optical parameters and electronic structure of conjugated polymer films by two commonly used techniques-spectrophotometry and ellipsometry. Poly(3-hexylthiophene (P3HT) and poly(3-octylthiophene (P3OT) conductive polymers films deposited on a glass substrate by the spin-coating technique showed very comparable surface structures composed of grains of similar sizes and shapes. X-ray tests confirmed that the polythiophene layers are amorphous, which confirmed the correctness of the choice of the optical models used. Selected optical models (Lorentz, Tauc-Lorentz and Cody-Lorentz) have been applied in order to determine the thickness, and optical parameters such as refractive index and extinction coefficient, absolute absorption and electronic parameters (energy gap E-g, amplitude A and broadening B). Spectral absorption determined from spectrophotometric measurement is similar to the absorption spectrum obtained from the ellipsometry method with the application of oscillator models.
引用
收藏
页码：1 / 12
页数：12
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