Nanopatterning of optical surfaces during low-energy ion beam sputtering

被引:3
|
作者
Liao, Wenlin [1 ,2 ]
Dai, Yifan [1 ,2 ]
Xie, Xuhui [1 ,2 ]
机构
[1] Natl Univ Def Technol, Coll Mechatron & Automat, Changsha 410073, Hunan, Peoples R China
[2] Hunan Key Lab Ultra Precis Machining Technol, Changsha 410073, Hunan, Peoples R China
基金
中国国家自然科学基金;
关键词
ion beam sputtering; ion nanopatterning; optical material surface; ultrasmooth surface; MICROSCOPIC MORPHOLOGY EVOLUTION; FUSED-SILICA;
D O I
10.1117/1.OE.53.6.065108
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Ion beam figuring (IBF) provides a highly deterministic method for high-precision optical surface fabrication, whereas ion-induced microscopic morphology evolution would occur on surfaces. Consequently, the fabrication specification for surface smoothness must be seriously considered during the IBF process. In this work, low-energy ion nanopatterning of our frequently used optical material surfaces is investigated to discuss the manufacturability of an ultrasmooth surface. The research results indicate that ion beam sputtering (IBS) can directly smooth some amorphous or amorphizable material surfaces, such as fused silica, Si, and ULE (R) under appropriate processing conditions. However, for IBS of a Zerodur (R) surface, preferential sputtering together with curvature-dependent sputtering overcome ion-induced smoothing mechanisms, leading to the granular nanopatterns' formation and the coarsening of the surface. Furthermore, the material property difference at microscopic scales and the continuous impurity incorporation would affect the ion beam smoothing of optical surfaces. Overall, IBS can be used as a promising technique for ultrasmooth surface fabrication, which strongly depends on processing conditions and material characters. (c) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
收藏
页数:6
相关论文
共 50 条
  • [1] Nanopatterning of silicon surfaces by low-energy ion-beam sputtering:: dependence on the angle of ion incidence
    Gago, R
    Vázquez, L
    Cuerno, R
    Varela, M
    Ballesteros, C
    Albella, JM
    NANOTECHNOLOGY, 2002, 13 (03) : 304 - 308
  • [2] Ion damage overrides structural disorder in silicon surface nanopatterning by low-energy ion beam sputtering
    Moreno-Barrado, A.
    Gago, R.
    Redondo-Cubero, A.
    Vazquez, L.
    Munoz-Garcia, J.
    Cuerno, R.
    Lorenz, K.
    Castro, M.
    EPL, 2015, 109 (04)
  • [3] Nanostructure formation and regulation during low-energy ion beam sputtering of fused silica surfaces
    Liao, Wenlin
    Dai, Yi-Fan
    Nie, Xutao
    Nie, Xuqing
    Xu, Mingjin
    OPTICAL ENGINEERING, 2017, 56 (12)
  • [4] Nanopatterning of mica surface under low energy ion beam sputtering
    Metya, A.
    Ghose, D.
    Mollick, S. A.
    Majumdar, A.
    JOURNAL OF APPLIED PHYSICS, 2012, 111 (07)
  • [5] Low-energy ion beam sputtering of pre-patterned fused silica surfaces
    Voellner, J.
    Ziberi, B.
    Frost, F.
    Rauschenbach, B.
    ION BEAMS AND NANO-ENGINEERING, 2010, 1181 : 129 - 134
  • [6] Destructive and constructive routes to prepare nanostructures on surfaces by low-energy ion beam sputtering
    Rauschenbach, Bernd
    Frost, Frank
    NANOSTRUCTURED THIN FILMS IX, 2016, 9929
  • [7] Low-energy cluster ion beam modification of surfaces
    Yamada, I
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 148 (1-4): : 1 - 11
  • [8] Topography evolution mechanism on fused silica during low-energy ion beam sputtering
    Voellner, J.
    Ziberi, B.
    Frost, F.
    Rauschenbach, B.
    JOURNAL OF APPLIED PHYSICS, 2011, 109 (04)
  • [9] Pattern transitions on Ge surfaces during low-energy ion beam erosion
    Ziberi, B
    Frost, F
    Rauschenbach, B
    APPLIED PHYSICS LETTERS, 2006, 88 (17)
  • [10] Self-organized nanopatterning of silicon surfaces by ion beam sputtering
    Munoz-Garcia, Javier
    Vazquez, Luis
    Castro, Mario
    Gago, Raul
    Redondo-Cubero, Andres
    Moreno-Barrado, Ana
    Cuerno, Rodolfo
    MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2014, 86 : 1 - 44