Double ionization of He by ion impact: Second-order contributions to the fully differential cross section

被引:5
作者
Lopez, S. D. [1 ,2 ]
Otranto, S. [3 ,4 ]
Garibotti, C. R. [1 ,2 ]
机构
[1] Consejo Nacl Invest Cient & Tecn, RA-8400 San Carlos De Bariloche, Rio Negro, Argentina
[2] Ctr Atom Bariloche, RA-8400 San Carlos De Bariloche, Rio Negro, Argentina
[3] Univ Nacl Sur, IFISUR, RA-8000 Bahia Blanca, Buenos Aires, Argentina
[4] Univ Nacl Sur, Dept Fis, RA-8000 Bahia Blanca, Buenos Aires, Argentina
来源
PHYSICAL REVIEW A | 2014年 / 89卷 / 06期
关键词
DOUBLE-ELECTRON-CAPTURE; 2ND BORN APPROXIMATION; EXCITATION-IONIZATION; SINGLE IONIZATION; ATOMIC-HYDROGEN; HELIUM; PROTONS; SCATTERING; COLLISIONS; CONTINUUM;
D O I
10.1103/PhysRevA.89.062709
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this work, we present a second-order Born series treatment for the double ionization of He by ion impact. In particular, we show that the well-known independent events and independent electron models naturally result from an on-shell treatment for the second-order Born approximation. A transition amplitude which coherently includes first-and second-order terms in the projectile interaction is introduced to study the role of the two-step-1, shake-off, and two-step-2 mechanisms at different impact energies. Fully differential cross sections for proton and antiproton impact are presented and analyzed for different projectile momentum transfers.
引用
收藏
页数:11
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