Room-temperature multiferroicity in GaFeO3 thin film grown on (100)Si substrate

被引:3
作者
Goswami, Sudipta [1 ]
Mishra, Shubhankar [1 ]
Dana, Kausik [2 ]
Mandal, Ashok Kumar [3 ]
Dey, Nitai [3 ]
Pal, Prabir [3 ]
Satpati, Biswarup [4 ]
Mukhopadhyay, Mrinmay [4 ]
Ghosh, Chandan Kumar [1 ]
Bhattacharya, Dipten [5 ]
机构
[1] Jadavpur Univ, Sch Mat Sci & Nanotechnol, Kolkata 700032, India
[2] CSIR Cent Glass & Ceram Res Inst, Refractories & Tradit Ceram Div, Kolkata 700032, India
[3] CSIR Cent Glass & Ceram Res Inst, Mat Characterizat & Instrumentat Div, Kolkata 700032, India
[4] Saha Inst Nucl Phys, A CI Homi Bhabha Natl Inst, Surface Phys & Mat Sci Div, 1 AF Bidhannagar, Kolkata 700032, India
[5] CSIR Cent Glass & Ceram Res Inst, Adv Mat & Chem Characterizat Div, Kolkata 700032, India
关键词
D O I
10.1063/5.0123397
中图分类号
O59 [应用物理学];
学科分类号
摘要
Room-temperature magnetoelectric multiferroicity has been observed in c-axis oriented GaFeO3 thin films (space group Pna2(1)), grown on economic and technologically important (100)Si substrates by a pulsed laser deposition technique. Structural analysis and comprehensive mapping of the Ga:Fe ratio across a length scale range of 10(4) reveals coexistence of epitaxial and chemical strain. It induces formation of finer magnetic domains and large magnetoelectric coupling-a decrease in remanent polarization by similar to 21% under similar to 50 kOe. Magnetic force microscopy reveals the presence of both finer (<100 nm) and coarser (similar to 2 mu m) magnetic domains. Strong multiferroicity in epitaxial GaFeO3 thin films, grown on a (100)Si substrate, brighten the prospect of their integration with Si-based electronics and could pave the way for development of economic and more efficient electromechanical, electrooptic, or magnetoelectric sensor devices. Published under an exclusive license by AIP Publishing.
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页数:9
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