Real-time interface investigation on degradation mechanism of organic light-emitting diode by in-operando X-ray spectroscopies

被引：3

作者：

Nie, Kaiqi ^{[1
,2
]}

Zhang, Hui ^{[1
,2
,3
]}

McLeod, John A. ^{[1
]}

Zhang, Duo ^{[1
]}

Zhou, Dongying ^{[1
,4
]}

Xia, Yujian ^{[1
]}

Zhong, Jun ^{[1
]}

Liao, Liangsheng ^{[1
]}

Guo, Jinghua ^{[2
,5
]}

Sun, Xuhui ^{[1
]}

机构：

[1] Soochow Univ, Soochow Univ Western Univ Ctr Synchrotron Radiat, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM,Joint Int Res L, Suzhou 215123, Peoples R China

[2] Lawrence Berkeley Natl Lab, Adv Light Source, 1 Cyclotron Rd, Berkeley, CA 94720 USA

[3] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China

[4] Soochow Univ, Coll Phys Optoelect & Energy, Soochow Inst Energy & Mat Innovat SIEMIS, Suzhou 215006, Peoples R China

[5] Univ Calif Santa Cruz, Dept Chem & Biochem, Santa Cruz, CA 95064 USA

来源：

ORGANIC ELECTRONICS | 2020年 / 87卷

基金：

国家重点研发计划;

关键词：

Organic light-emitting diode; In-operando; X-ray absorption spectroscopy; Interface interaction; Degradation mechanism; ELECTRONIC-STRUCTURE; ALQ(3); ELECTROLUMINESCENCE; SUBSTITUTION; DENSITY;

D O I：

10.1016/j.orgel.2020.105901

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Understanding the chemical evolution at the interface of organic light-emitting diodes (OLEDs) under working conditions is critical for addressing device failure and further improving performance. In this work, an inoperando approach was developed employing synchrotron-based X-ray absorption spectroscopy (XAS) to investigate the electronic structures and chemical degradation mechanisms of a model tris(8-hydroxyquinoline) aluminum (Alq(3))-based OLED device under working condition. The results identify that Mg atoms from the electrode migrate into the Alg a organic layer under a potential bias and replace Al atom sites, forming the unstable Mgq(3) species which lead to device degradation. The findings from the classic and simple model device elucidate the degradation mechanisms occurred at the interface of OLED devices, which may facilitate the development of more efficient and stable OLED devices with complex structures.

引用

页数：5

共 32 条

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