X-ray diffraction effects in submicron slits and channels

被引：5
|
作者：
Ognev, LI [1 ]
机构：
[1] RRC Kurchatov Inst, Nucl Fus Inst, Moscow 123182, Russia
来源：
X-RAY SPECTROMETRY | 2002年 / 31卷 / 03期
关键词：
D O I：
10.1002/xrs.594
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The effects of diffraction on capture of the radiation into narrow channels between two weakly rough surfaces pressed together ('slitless collimator') and channeling of x-radiation in a three-layered structure with low atomic number thin film inside were investigated, The influence of channel shape distortion and its surface quality on the formation of the outgoing beam was investigated. A plausible explanation is given for the observed effect of abnormality of transmission through Cr/C/Cr thin-film channels with account of periodic deformation, The calculations of the X-ray waveguide mode attenuation in thin rough channels were compared with the results of numerical integration of the quasi-optical equation for electrical field amplitude. Copyright (C) 2002 John Wiley Sons, Ltd.
引用
收藏
页码：274 / 277
页数：4
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