Defect images by planar ECT probe of meander-mesh coils

被引：16

作者：

Yamada, S ^{[1
]}

Katou, M ^{[1
]}

Iwahara, M ^{[1
]}

Dawson, FP ^{[1
]}

机构：

[1] UNIV TORONTO,DEPT ELECT & COMP ENGN,TORONTO,ON M5S 1A4,CANADA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1996年 / 32卷 / 05期

关键词：

Cracks - Defects - Eddy current testing - Electric current distribution - Fabrication - Image analysis - Imaging techniques - Magnetic fields - Nickel alloys;

D O I：

10.1109/20.539300

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents results pertaining to image data obtained from a planar meander-mesh coupled coil type ECT probe. The image data makes it possible to detect not only the existence of a defect but also to extract detailed information regarding the nature of the defect, such as its position, shape, length, and direction, In order to recognize a defect distinctly, we have fabricated the high sensitive planar coil which can be used to image a 2-D representation of the ECT signal, The relationships between the image pattern and defect shape are discussed.

引用

页码：4956 / 4958

页数：3