Raman scattering of InSb quantum dots grown on InP substrates

被引:30
作者
Armelles, G
Utzmeier, T
Postigo, PA
Briones, F
Ferrer, JC
Peiro, P
Cornet, A
机构
[1] CSIC,CNM,INST MICROELECT MADRID,PTM,E-28760 MADRID,SPAIN
[2] UNIV BARCELONA,DEPT FIS APLICADA & ELECT,E-08028 BARCELONA,SPAIN
关键词
D O I
10.1063/1.365169
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this paper we present the Raman scattering of self-assembled InSb dots grown on (001) oriented InP substrates, The samples were grown by pulsed molecular beam epitaxy mode. Two types of samples have been investigated. In one type the InSb dots were capped with 200 monolayers of InP; in the other type no capping was deposited after the InSb dot formation. We observe two peaks in the Raman spectra of the uncapped dot, while only one peak is observed in the Raman spectra of the capped dots. In the case of the uncapped dots the peaks are attributed to LO-like and TO-like vibration of completely relaxed InSb dots, in agreement with high resolution transmission electron microscopy photographs. The Raman spectra of the capped dot suggest a different strain stare in the dot due to the capping layer. (C) 1997 American Institute of Physics.
引用
收藏
页码:6339 / 6342
页数:4
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