Dimethyl sulfoxide by near-ambient pressure XPS

被引：22

作者：

Avval, Tahereh G. ^{[1
]}

Cushman, Cody V. ^{[1
]}

Bahr, Stephan ^{[2
]}

Dietrich, Paul ^{[2
]}

Meyer, Michael ^{[2
]}

Thissen, Andreas ^{[2
]}

Linford, Matthew R. ^{[1
]}

机构：

[1] Brigham Young Univ, Dept Chem & Biochem, C100 BNSN, Provo, UT 84602 USA

[2] SPECS Surface Nano Anal GmbH, Voltastr 5, D-13355 Berlin, Germany

来源：

SURFACE SCIENCE SPECTRA | 2019年 / 26卷 / 01期

关键词：

near-ambient pressure x-ray photoelectron spectroscopy; NAP-XPS; XPS; dimethyl sulfoxide; DMSO; organic solvent; PHOTOELECTRON-SPECTROSCOPY;

D O I：

10.1116/1.5053099

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., greater than 2500 Pa. With NAP-XPS, XPS can probe moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show survey, O 1s, C 1s, S 2p, and S 2s NAP-XPS spectra from dimethyl sulfoxide (DMSO), a widely used organic solvent that is miscible with water. The sample was analyzed directly in its native, liquid state at room temperature. In general, both liquid and gas phase peaks are observed in the narrow scans. Due to the importance of DMSO in both chemistry and biology, it is likely that it will appear in future NAP-XPS analyses. Accordingly, these data may serve as a reference for future work. Published by the AVS.

引用

页数：6

共 12 条

[1]

Briggs D., 2003, Practical surface analysis: by auger and x-ray photoelectron spectroscopy

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