Electron microscope calibration for the Lorentz mode

The calibration of a modern electron microscope for Lorentz microscopy observations has been performed using diffractogram, Fresnel diffraction fringe analysis and low-angle electron diffraction methods. An example related to the observations of electrostatic fields associated to a thinned reverse-biased p-n junction is also reported. (C) 2004 Elsevier B.V. All rights reserved.