Mapping hard magnetic recording disks by TOF-SIMS

被引:1
|
作者
Spool, A. [1 ]
Forrest, J. [1 ]
机构
[1] Hitachi Global Storage Technol Inc, San Jose, CA 95193 USA
关键词
ToF-SIMS; Secondary ion imaging; Magnetic recording disks; Static SIMS; Multivariate statistical analysis; Principal component analysis; Inverse squared distance weighting;
D O I
10.1016/j.apsusc.2008.05.009
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Mapping of hard magnetic recording disks by TOF-SIMS was performed both to produce significant analytical results for the understanding of the disk surface and the head disk interface in hard disk drives, and as an example of a macroscopic non-rectangular mapping problem for the technique. In this study, maps were obtained by taking discrete samples of the disk surface at set intervals in R and Theta. Because both in manufacturing, and in the disk drive, processes that may affect the disk surface are typically circumferential in nature, changes in the surface are likely to be blurred in the Theta direction. An algorithm was developed to determine the optimum relative sampling ratio in R and Theta. The results confirm what the experience of the analysts suggested, that changes occur more rapidly on disks in the radial direction, and that more sampling in the radial direction is desired. The subsequent use of statistical methods principle component analysis (PCA), maximum auto-correlation factors (MAF), and the algorithm inverse distance weighting (IDW) are explored. (C) 2008 Elsevier B. V. All rights reserved.
引用
收藏
页码:1482 / 1485
页数:4
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