Electrical Double-Slope Nonideality in Organic Field-Effect Transistors

被引:55
作者
Hung Phan [1 ]
Ford, Michael J. [1 ]
Lill, Alexander T. [1 ]
Wang, Ming [1 ]
Bazan, Guillermo C. [1 ]
Thuc-Quyen Nguyen [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Chem & Biochem, Ctr Polymers & Organ Solids, Mitsubishi Chem Ctr Adv Mat, Santa Barbara, CA 93106 USA
关键词
charge trapping; contact resistance; D-A polymers; double-slope nonideality; organic field-effect transistors; THIN-FILM TRANSISTORS; SELF-ASSEMBLED MONOLAYERS; CHARGE-CARRIER MOBILITY; THRESHOLD VOLTAGE SHIFTS; HIGH-HOLE-MOBILITY; HIGH-PERFORMANCE; N-TYPE; CONJUGATED POLYMERS; SEMICONDUCTING POLYMERS; CONTACT RESISTANCE;
D O I
10.1002/adfm.201707221
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The field effect transistor (FET) is arguably one of the most important circuit elements in modern electronics. Recently, a need has developed for flexible electronics in a variety of emerging applications. Examples include form-fitting healthcare-monitoring devices, flexible displays, and flexible radio frequency identification tags. Organic FETs (OFETs) are viable candidates for producing such flexible devices because they incorporate semiconducting pi-conjugated materials, including small molecules and conjugated polymers, which are intrinsically soft and mechanically compatible with flexible substrates. For OFETs to be industrially viable, however, they must achieve not only high charge carrier mobility, but also ideal and comprehensible electrical characteristics. Most recently, nonideal double-slope characteristics in the transfer curves of OFETs (i.e., high slope at low gate voltage and low slope at high gate voltage), have stirred debate, which has led to different mechanistic rationales in the literature. This review focuses on the general observations, mechanistic understanding, and possible solutions associated with phenomena that result in FETs with double-slope characteristics. By surveying and systematically summarizing in a single source relevant literature that deals with the issue of double slope, the experimental framework and theoretical basis for interpreting and avoiding this electrical nonideality in OFETs is provided.
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页数:26
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