Comparative analysis of hole transport in compressively strained InSb and Ge quantum well heterostructures

被引:3
作者
Agrawal, Ashish [1 ]
Barth, Michael [1 ]
Madan, Himanshu [1 ]
Lee, Yi-Jing [2 ]
Lin, You-Ru [2 ]
Wu, Cheng-Hsien [2 ]
Ko, Chih-Hsin [2 ]
Wann, Clement H. [2 ]
Loubychev, Dmitri [3 ]
Liu, Amy [3 ]
Fastenau, Joel [3 ]
Lindemuth, Jeff [4 ]
Datta, Suman [1 ]
机构
[1] Penn State Univ, Dept Elect Engn, University Pk, PA 16802 USA
[2] Taiwan Semicond Mfg Co, Hsinchu 30078, Taiwan
[3] IQE Inc, Bethlehem, PA 18015 USA
[4] Lake Shore Cryotron, Westerville, OH 43082 USA
关键词
14;
D O I
10.1063/1.4892403
中图分类号
O59 [应用物理学];
学科分类号
摘要
Compressively strained InSb (s-InSb) and Ge (s-Ge) quantum well heterostructures are experimentally studied, with emphasis on understanding and comparing hole transport in these two-dimensional confined heterostructures. Magnetotransport measurements and bandstructure calculations indicate 2.5x lower effective mass for s-InSb compared to s-Ge quantum well at 1.9 x 10(12) cm(-2). Advantage of strain-induced m* reduction is negated by higher phonon scattering, degrading hole transport at room temperature in s-InSb quantum well compared to s-Ge heterostructure. Consequently, effective injection velocity is superior in s-Ge compared to s-InSb. These results suggest s-Ge quantum well heterostructure is more favorable and promising p-channel candidate compared to s-InSb for future technology node. (C) 2014 AIP Publishing LLC.
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页数:4
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