Focused electron beam induced deposition as a tool to create electron vortices

被引：22

作者：

Beche, A. ^{[1
]}

Winkler, R. ^{[2
]}

Plank, H. ^{[2
,3
]}

Hofer, F. ^{[3
]}

Verbeeck, J. ^{[1
]}

机构：

[1] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium

[2] Graz Ctr Electron Microscopy, A-8010 Graz, Austria

[3] Graz Univ Technol, Inst Electron Microscopy & Nanoanal, A-8010 Graz, Austria

来源：

MICRON | 2016年 / 80卷

基金：

欧洲研究理事会;

关键词：

Focused electron beam induced deposition (FEBID); Transmission electron microscope (TEM); Vortex; Holography; ORBITAL ANGULAR-MOMENTUM; VORTEX BEAMS; PHASE-PLATE;

D O I：

10.1016/j.micron.2015.07.011

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Focused electron beam induced deposition (FEBID) is a microscopic technique that allows geometrically controlled material deposition with very high spatial resolution. This technique was used to create a spiral aperture capable of generating electron vortex beams in a transmission electron microscope (TEM). The vortex was then fully characterized using different TEM techniques, estimating the average orbital angular momentum to be similar to 0.8 (h) over bar per electron with almost 60% of the beam ending up in the l = 1 state. (C) 2015 Elsevier Ltd. All rights reserved.

引用

页码：34 / 38

页数：5

共 23 条

[1]

Béché A, 2014, NAT PHYS, V10, P26, DOI [10.1038/NPHYS2816, 10.1038/nphys2816]

[2] Measuring orbital angular momentum superpositions of light by mode transformation [J].