Equi-Noise: A Statistical Model That Combines Embedded Memory Failures and Channel Noise

被引：7

作者：

Khairy, Muhammad S. ^{[1
]}

Khajeh, Amin ^{[2
]}

Eltawil, Ahmed M. ^{[1
]}

Kurdahi, Fadi J. ^{[1
]}

机构：

[1] Univ Calif Irvine, Dept Elect Engn & Comp Sci, Irvine, CA 92697 USA

[2] Intel Labs, Hillsboro, OR 97124 USA

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | 2014年 / 61卷 / 02期

基金：

美国国家科学基金会;

关键词：

Embedded memories; fault tolerant; low power; SRAM; wireless communications; PROCESSOR;

D O I：

10.1109/TCSI.2013.2268197

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper exploits the predominance of embedded memories in current and emerging wireless transceivers as a means to save power via channel state aware voltage scaling. The paper presents a statistical model that captures errors in embedded memories due to voltage over-scaling and maps the errors to a Gaussian distribution that represents a combination of communication channel noise and hardware noise. Designers can use the proposed model to investigate different power management policies, that capture the performance of the system as a function of both channel and hardware dynamics, thus creating a much richer design space of power, performance and reliability. A case study of a DVB receiver is presented and the validity of the proposed model is confirmed by simulations.

引用

页码：407 / 419

页数：13

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