Time-Resolved X-Ray Microscopy for Materials Science

被引：0

作者：

Wen, Haidan ^{[1
]}

Cherukara, Mathew J. ^{[2
]}

Holt, Martin V. ^{[2
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[2] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

来源：

ANNUAL REVIEW OF MATERIALS RESEARCH, VOL 49 | 2019年 / 49卷

关键词：

X-ray microscopy; time resolved; nanoscale; structural dynamics; PHASE RETRIEVAL; ULTRAFAST; DYNAMICS; DIFFRACTION; VISUALIZATION; SPECTROSCOPY; CHALLENGES; STRAIN; REAL;

D O I：

10.1146/annurev-matsci-070616-124014

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray microscopy has been an indispensable tool to image nanoscale properties for materials research. One of its recent advances is extending microscopic studies to the time domain to visualize the dynamics of nanoscale phenomena. Large-scale X-ray facilities have been the powerhouse of time-resolved X-ray microscopy. Their upgrades, including a significant reduction of the X-ray emittance at storage rings (SRs) and fully coherent ultrashort X-ray pulses at free-electron lasers (FELs), will lead to new developments in instrumentation and will open new scientific opportunities for X-ray imaging of nanoscale dynamics with the simultaneous attainment of unprecedentedly high spatial and temporal resolutions. This review presents recent progress in and the outlook for time-resolved X-ray microscopy in the context of ultrafast nanoscale imaging and its applications to condensed matter physics and materials science.

引用

页码：389 / 415

页数：27

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