Versatile UHV system for combined far- and near-field magneto-optical microscopy of thin films

被引：5

作者：

Meyer, G ^{[1
]}

Crecelius, T ^{[1
]}

Kaindl, G ^{[1
]}

Bauer, A ^{[1
]}

机构：

[1] Free Univ Berlin, Fachbereich Phys, Inst Expt Phys, D-14195 Berlin, Germany

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2002年 / 240卷 / 1-3期

关键词：

magneto-optics; magnetic imaging; domains; scanning near-field microscopy;

D O I：

10.1016/S0304-8853(01)00742-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have developed a UHV system for in situ studies of magnetic domains and magnetization reversal of thin films in the presence of external magnetic fields and at variable temperature. The system comprises a setup for magneto-optical Kerr effect measurements of magnetization curves, a Kerr-microscope for far-field magnetic-domain imaging, and a magneto-optical scanning near-field microscope in combination with a Sagnac interferometer (Sagnac-SNOM) for high-resolution imaging on a sub-mum scale. All components have successfully been tested, and the feasibility of studying ultrathin films has been demonstrated. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：76 / 78

页数：3

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