Image correction for atomic force microscopy images with functionalized tips

被引：51

作者：

Neu, M. ^{[1
]}

Moll, N. ^{[2
]}

Gross, L. ^{[2
]}

Meyer, G. ^{[2
]}

Giessibl, F. J. ^{[1
]}

Repp, J. ^{[1
]}

机构：

[1] Univ Regensburg, Inst Expt & Appl Phys, D-93053 Regensburg, Germany

[2] IBM Res Zurich, CH-8803 Ruschlikon, Switzerland

来源：

PHYSICAL REVIEW B | 2014年 / 89卷 / 20期

关键词：

SINGLE-MOLECULE; REAL-SPACE; RESOLUTION; IDENTIFICATION; SPECTROSCOPY; GRAPHENE;

D O I：

10.1103/PhysRevB.89.205407

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

It has been demonstrated that atomic force microscopy imaging with CO-functionalizedtips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the tip apex is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems.

引用

页数：7

共 34 条

[1]

Albers BJ, 2009, NAT NANOTECHNOL, V4, P307, DOI [10.1038/NNANO.2009.57, 10.1038/nnano.2009.57]

[2] Formation and Characterization of a Molecule-Metal-Molecule Bridge in Real Space [J].

Albrecht, Florian ;

Neu, Mathias ;

Quest, Christina ;

Swart, Ingmar ;

Repp, Jascha .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2013, 135 (24) :9200-9203

[3] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].

ALBRECHT, TR ;

GRUTTER, P ;

HORNE, D ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673

[4] Sample Corrugation Affects the Apparent Bond Lengths in Atomic Force Microscopy [J].

Boneschanscher, Mark P. ;

Hamalainen, Sampsa K. ;

Liljeroth, Peter ;

Swart, Ingmar .

ACS NANO, 2014, 8 (03) :3006-3014

[5] Quantitative Atomic Resolution Force Imaging on Epitaxial Graphene with Reactive and Nonreactive AFM Probes [J].

Boneschanscher, Mark P. ;

van der Lit, Joost ;

Sun, Zhixiang ;

Swart, Ingmar ;

Liljeroth, Peter ;

Vanmaekelbergh, Daniel .

ACS NANO, 2012, 6 (11) :10216-10221

[6] Direct Imaging of Covalent Bond Structure in Single-Molecule Chemical Reactions [J].

de Oteyza, Dimas G. ;

Gorman, Patrick ;

Chen, Yen-Chia ;

Wickenburg, Sebastian ;

Riss, Alexander ;

Mowbray, Duncan J. ;

Etkin, Grisha ;

Pedramrazi, Zahra ;

Tsai, Hsin-Zon ;

Rubio, Angel ;

Crommie, Michael F. ;

Fischer, Felix R. .

SCIENCE, 2013, 340 (6139) :1434-1437

[7]

Durig U, 1997, J APPL PHYS, V82, P3641, DOI 10.1063/1.365726

[8] Structural and electronic properties of pentacene molecule and molecular pentacene solid [J].

Endres, RG ;

Fong, CY ;

Yang, LH ;

Witte, G ;

Wöll, C .

COMPUTATIONAL MATERIALS SCIENCE, 2004, 29 (03) :362-370

[9] Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork [J].

Giessibl, FJ .

APPLIED PHYSICS LETTERS, 2000, 76 (11) :1470-1472

[10] Advances in atomic force microscopy [J].

Giessibl, FJ .

REVIEWS OF MODERN PHYSICS, 2003, 75 (03) :949-983

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