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A simple and continuous polycrystalline silicon thin-film transistor model for SPICE implementation
被引:12
作者:

Pappas, I.
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机构:
Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece

Hatzopoulos, A. T.
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h-index: 0
机构: Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece

Tassis, D. H.
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h-index: 0
机构: Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece

Arpatzanis, N.
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h-index: 0
机构: Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece

Siskos, S.
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机构: Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece

Dimitriadis, C. A.
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机构: Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece

Kamarinos, G.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece
机构:
[1] Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece
[2] ENSERG, IMEP, F-38016 Grenoble 1, France
关键词:
ELECTRICAL CHARACTERISTICS;
TFT;
D O I:
10.1063/1.2226979
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
A simple current-voltage model for polycrystalline silicon thin-film transistors (polysilicon TFTs) is proposed, including the sixth-order polynomial function coefficients fitted to the effective mobility versus gate voltage data, the channel length modulation, and impact ionization effects. The model possesses continuity of current in the transfer characteristics from weak to strong inversion and in the output characteristics throughout the linear and saturation regions of operation. The model parameters are used as input parameters in AIM-SPICE circuit simulator for device modeling. The model has been applied in a number of long and short channel TFTs, and the statistical distributions of the model parameters have been derived which are useful for checking the functionality of TFTs circuits with AIM-SPICE. (c) 2006 American Institute of Physics.
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