Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin Films

被引:0
作者
Govindasamy, Geetha [1 ]
Murugasen, Priya [2 ]
Sagadevan, Suresh [3 ]
机构
[1] Bharathiar Univ, R&D Ctr, Coimbatore, Tamil Nadu, India
[2] Saveetha Engn, Dept Phys, Madras, Tamil Nadu, India
[3] AMET Univ, Dept Phys, Madras, Tamil Nadu, India
来源
MATERIALS RESEARCH-IBERO-AMERICAN JOURNAL OF MATERIALS | 2017年 / 20卷 / 01期
关键词
CoS; CBD; XRD; SEM; Dielectric studies; AC and DC electrical conductivity measurement; GROWTH; SEMICONDUCTOR; SE;
D O I
10.1590/1980-5373-MR-2016-0441
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Cobalt sulphide (CoS) thin films were synthesized using the Chemical Bath Deposition (CBD) technique. X-ray diffraction (XRD) analysis was used to study the structure and the crystallite size of CoS thin film. Scanning Electron Microscope (SEM) studies reveal the surface morphology of these films. The optical properties of the CoS thin films were determined using UV-Visible absorption spectrum. The optical band gap of the thin films was found to be 1.6 eV. Optical constants such as the refractive index, the extinction coefficient and the electric susceptibility were determined. The dielectric studies were carried out at different frequencies and at different temperatures for the prepared CoS thin films. In addition, the plasma energy of the valence electron, Penn gap or average energy gap, the Fermi energy and electronic polarizability of the thin films were determined. The AC electrical conductivity measurement was also carried out for the thin films. The activation energy was determined by using DC electrical conductivity measurement.
引用
收藏
页码:62 / 67
页数:6
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