Microcrystalline silicon. Growth and device application

被引:248
作者
Matsuda, A [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058658, Japan
关键词
D O I
10.1016/j.jnoncrysol.2004.02.012
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Processes used to grow hydrogenated microcrystalline silicon (muc-Si:H) from a H-2/SiH4-glow discharge plasma are explained in comparison to those for hydrogenated amorphous silicon (a-Si:H). Differences and similarities between muc-Si:H and a-Si:H-growth reactions in the plasma and on the film-growing surface are discussed, and the nucleus-formation process followed by epitaxial-like crystal growth process is illustrated as unique processes for the formulation of muc-Si:H. Determination of the effect of dangling-bond defect density on the propagation of the resulting muc-Si:H films is also discussed in parallel with the effect on a-Si:H in order to obtain a clue to improve opto-electronic properties of those materials for device applications especially for thin-film-silicon solar cells. Material issues to produce low cost and high efficiency solar cells are described, and finally recent progress in those issues is demonstrated. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:1 / 12
页数:12
相关论文
共 51 条
  • [1] Stress-induced nucleation of microcrystalline silicon from amorphous phase
    Fujiwara, H
    Kondo, M
    Matsuda, A
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (5A): : 2821 - 2828
  • [2] Micro crystalline silicon nucleation sites in the sub-surface of hydrogenated amorphous silicon
    Fujiwara, H
    Kondo, M
    Matsuda, A
    [J]. SURFACE SCIENCE, 2002, 497 (1-3) : 333 - 340
  • [3] Real-time spectroscopic ellipsometry studies of the nucleation and grain growth processes in microcrystalline silicon thin films
    Fujiwara, H
    Kondo, M
    Matsuda, A
    [J]. PHYSICAL REVIEW B, 2001, 63 (11)
  • [4] Structural study of initial layer for μc-Si:H growth using real time in situ spectroscopic ellipsometry and infrared spectroscopy
    Fujiwara, H
    Toyoshima, Y
    Kondo, M
    Matsuda, A
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 2000, 266 : 38 - 42
  • [5] DEPOSITION OF HIGH-QUALITY A-SI-H BY DIRECT PHOTODECOMPOSITION OF SI2H6 USING VACUUM ULTRAVIOLET-LIGHT
    FUYUKI, T
    DU, KY
    OKAMOTO, S
    YASUDA, S
    KIMOTO, T
    YOSHIMOTO, M
    MATSUNAMI, H
    [J]. JOURNAL OF APPLIED PHYSICS, 1988, 64 (05) : 2380 - 2383
  • [6] DEFECT FORMATION DURING GROWTH OF HYDROGENATED AMORPHOUS-SILICON
    GANGULY, G
    MATSUDA, A
    [J]. PHYSICAL REVIEW B, 1993, 47 (07) : 3661 - 3670
  • [7] DEFECT FORMATION PROCESS DURING GROWTH OF HYDROGENATED AMORPHOUS-SILICON AT HIGH-TEMPERATURES
    GANGULY, G
    MATSUDA, A
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1992, 31 (9A): : L1269 - L1271
  • [8] Hydrogenated microcrystalline silicon germanium: A bottom cell material for amorphous silicon-based tandem solar cells
    Ganguly, G
    Ikeda, T
    Nishimiya, T
    Saitoh, K
    Kondo, M
    Matsuda, A
    [J]. APPLIED PHYSICS LETTERS, 1996, 69 (27) : 4224 - 4226
  • [9] GANGULY G, 1993, J NON-CRYST SOLIDS, V164, P31, DOI 10.1016/0022-3093(93)90485-G
  • [10] GUHA S, 1994, MATER RES SOC SYMP P, V336, P675, DOI 10.1557/PROC-336-675