Wafer-level packaging technology for high-Q on-chip inductors and transmission lines

In the current trend toward portable applications, high-Q integrated inductors have gained considerable importance. Hence, much effort has been spent to increase the performance of on-chip Si inductors. In this paper, wafer-level packaging (WLP) techniques have been used to integrate state-of-the-art high-Q on-chip inductors on top of a five-levels-of-metal Cu damascene back-end of line (BEOL) silicon process using 20-Omega (.) cm Si wafers. The inductors are realized above passivation using thick post-processed low-K dielectric benzocyclobutene (BCB) and Cu layers. For a BCB-Cu thickness of 16 mum/10 mum, a peak single-ended Q factor of 38 at 4.7 GHz has been measured for a 1-nH inductor with a resonance frequency of 28 GHz. Removing substrate contacts slightly increases the performance, though a more significant improvement has been obtained by combining post-processed passives with patterned ground shields: for a 2.3-nH above integrated-circuit (above-IC) inductor, a 115% increase in Q(BW)(max) (37.5 versus 17.5) and a 192% increase in resonance frequency (F-res: 12 GHz versus 5 GHz) have been obtained as compared to the equivalent BEOL realization with a patterned ground shield. Next to inductors, high-quality on-chip transmission lines may be realized in the WLP layers. Losses below -0.2 dB/mm at 25 GHz have been measured for 5042 post-processed coplanar-waveguide lines, above-IC thin-film microstrip lines have measured losses below -0.12 dB/mm at 25 GHz.