A resonant tunneling diode (RID) with a multiplication region is designed for light detection in this paper. Via adding a n(+)-i-p(+) multiplication region, we focus on promoting the photocurrent and light sensitivity of the detector. Through the calculation of the multiplication factor, the thickness of the multiplication region is determined. The influence factors of the electric field and potential distribution of the detector are investigated, thereby the thickness and doping concentration of the doped layers besides the double-barrier structure COBS) are decided. Detectors with and without a multiplication region are fabricated from semiconductor heterostructures grown by molecular beam epitaxy. The current-voltage (I-V) and light sensitivity tests show that the detector with a multiplication region has better performance in peak photocurrent and light sensitivity. (C) 2014 Elsevier B.V. All rights reserved.
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Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Univ Cambridge, Dept Engn, Cambridge CB3 0FA, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Patel, K. A.
Dynes, J. F.
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Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Dynes, J. F.
Sharpe, A. W.
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Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Sharpe, A. W.
Yuan, Z. L.
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Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Yuan, Z. L.
Penty, R. V.
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Univ Cambridge, Dept Engn, Cambridge CB3 0FA, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Penty, R. V.
Shields, A. J.
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Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
机构:
Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Univ Cambridge, Dept Engn, Cambridge CB3 0FA, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Patel, K. A.
Dynes, J. F.
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h-index: 0
机构:
Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Dynes, J. F.
Sharpe, A. W.
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Sharpe, A. W.
Yuan, Z. L.
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Yuan, Z. L.
Penty, R. V.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Cambridge, Dept Engn, Cambridge CB3 0FA, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England
Penty, R. V.
Shields, A. J.
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, EnglandToshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0GZ, England