Ultrahigh vacuum non-contact atomic force microscope observation of reconstructed Si(110) surface

被引：1
|
作者：
Miyachi, Akihira [1 ]
Sone, Hayato [1 ]
Hosaka, Sumio [1 ]
机构：
[1] Gunma Univ, Grad Sch Engn, Dept Nanomat Syst, Kiryu, Gumma 3768515, Japan
来源：
MATERIALS TRANSACTIONS | 2006年 / 47卷 / 10期
关键词：
ultrahigh-vacuum; non-contact atomic force microscope; silicon (110); 16; x; 2; (17,15,1) 2 x 1; 32;
D O I：
10.2320/matertrans.47.2595
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We tried to observe a reconstructed Si(110) surface using an ultrahigh-vacuum (UHV) non-contact atomic force microscope (NC-AFM). The Si(110) surface has several characteristic structures, such as the 16 x 2, (17, 15, 1) 2 x 1, 1 x 1, zigzag structures. We succeeded in the AFM observation of the surface formed upon annealing the samples in direct current heating so as to clean the surface. We obtained the same structures in the AFM observation as the proposed 16 x 2 model of a Si(110) reconstruction in a STM observation. The UHV NC-AFM results demonstrate that the Si(110) surface has a characteristic 16 x 2 structure for the first time observation.
引用
收藏
页码：2595 / 2598
页数：4
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