Direct silicon-silicon bonding by electromagnetic induction heating

被引:46
作者
Thompson, K [1 ]
Gianchandani, YB
Booske, J
Cooper, RF
机构
[1] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA
[2] Univ Wisconsin, Dept Mat Sci & Engn, Madison, WI 53706 USA
基金
美国国家科学基金会;
关键词
bonding; electromagnetic; radiation; silicon;
D O I
10.1109/JMEMS.2002.800929
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel beating technique, electromagnetic induction heating (EMIH), uses electromagnetic radiation, ranging in frequency from a few megahertz to tens of gigahertz, to volumetrically heat silicon above 1000 degreesC in only a few seconds. Typical power requirements fall between 900 to 1300 W for silicon wafers 75 to 100 mm in diameter. This technique has successfully produced direct silicon wafer-to-wafer bonds without the use of an intermediate glue layer. Infrared images indicate void free bonds that could not be delaminated with knife-edge tests. In addition, four pairs of stacked wafers were bonded simultaneously in 5 min, demonstrating the potential for multiwafer bonds and high-throughput batch processing.
引用
收藏
页码:285 / 292
页数:8
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